Low Voltage Electron Microscopy: Principles and Applications

Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing.

It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.

Content:
Chapter 1 Introduction to the Theory and Advantages of Low Voltage Electron Microscopy (pages 1–30): David C. Bell and Natasha Erdman
Chapter 2 SEM Instrumentation Developments for Low kV Imaging and Microanalysis (pages 31–55): Natasha Erdman and David C. Bell
Chapter 3 Extreme High?Resolution (XHR) SEM Using a Beam Monochromator (pages 57–71): Richard J. Young, Gerard N. A. van Veen, Alexander Henstra and Lubomir Tuma
Chapter 4 The Application of Low?Voltage SEM—From Nanotechnology to Biological Research (pages 73–95): Natasha Erdman and David C. Bell
Chapter 5 Low Voltage High?Resolution Transmission Electron Microscopy (pages 97–117): David C. Bell
Chapter 6 Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits (pages 119–161): Ondrej L. Krivanek, Wu Zhou, Matthew F. Chisholm, Juan Carlos Idrobo, Tracy C. Lovejoy, Quentin M. Ramasse and Niklas Dellby
Chapter 7 Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces (pages 163–184): Robert Klie
Chapter 8 What's Next? The Future Directions in Low Voltage Electron Microscopy (pages 185–200): David C. Bell and Natasha Erdman